作者: Rita Spano , Nicola Daldosso , Massimo Cazzanelli , Luigi Ferraioli , Luca Tartara
DOI: 10.1364/OE.17.003941
关键词:
摘要: We present a detailed investigation of the different processes responsible for the optical nonlinearities of silicon nanocrystals at 1550 nm. Through z-scan measurements, the bound …