Structural, magnetic and electronic structure properties of pure and Ti doped Mg0.95Mn0.05Fe2O4 nanocrystalline thin films
作者： Shalendra Kumar , Faheem Ahmed , MS Anwar , BH Koo , HK Choi
DOI: 10.1016/J.CERAMINT.2012.07.113
关键词:
摘要: Abstract Thin films of pure and Ti doped Mg 0.95 Mn 0.05 Fe 2 O 4 deposited using pulsed laser deposition technique, have been characterized X-ray diffraction, Raman spectroscopy, dc magnetization, atomic force microscopy, magnetic microscopy near edge absorption fine structure spectroscopy measurements. diffraction measurements indicate that both the single phase polycrystalline behavior with FCC structure. The grain size calculated XRD data was 18 27 nm for films, respectively. Magnetic reflect film has superparamagnetic while soft ferrimagnetic at room temperature. Atomic are nanocrystalline in nature. Near clearly infer ions mixed valence state.
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