Dependence of threshold thickness of crystallization and film morphology on film processing conditions in poly(vinylidene fluoride-trifluoroethylene) copolymer thin films

摘要: In spin-cast films of poly(vinylidene fluoride–trifluoroethylene) on metalized silicon substrate, there exists a threshold thickness crystallization dth, below which the crystallinity drops precipitously. Due to direct link between and functional properties in polymer, is corresponding large change film ferroelectric properties, including dielectric constant, polarization level, switching speed, as reduced dth. Detail microstructure studies show that this controlled by stable crystal lamellar size along direction. By varying processing condition reduce direction, dth can be markedly. As result, better responses were obtained ultrathin films.