Critical thickness of crystallization and discontinuous change in ferroelectric behavior with thickness in ferroelectric polymer thin films

摘要: We report on the observation of critical thickness crystallization ferroelectric poly(vinylidene fluoride-trifluoroethylene) copolymer thin films, which were solution spun cast platinum coated silicon wafer. The effect occurs at about 100 nm thickness, is significantly above any currently known spatial dimensions polymer, so that for films below nm, process strongly hindered, resulting in a low crystallinity these films. This leads to large and discontinuous change dielectric constant polarization thickness.