作者: Sang Hyun Park , Jun-Sik Cho , Kyung Hoon Yoon
DOI: 10.1007/S13391-011-0290-2
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摘要: Research on the long-term reliability and durability of photovoltaic (PV) moduleshas beengaining significant importancedue to long term outside installation such modules, which can be in place for more than 20 years. For practical reasonable estimation durability, a detailed understanding each degradation factor is important. In this work, differences a-Si:H thin film, depending load conditions during light irradiance, have been evaluated. Temperature voltage at output port solar cell evaluated detail dominant factors are discussed. Along with therecent rapid extensive progress PV module qualification, work reports results photo-induced based film cells.