Detection of defects in SiC crystalline films by Raman scattering
作者： S. Nakashima , Y. Nakatake , Y. Ishida , T. Talkahashi , H. Okumura
DOI: 10.1016/S0921-4526(01)00795-5
关键词:
摘要: … SiC films and bulk crystals are detected by Raman scattering. It is found that the observation of defect activated transverse optic bands at a Raman … of the defect activated Raman band is …
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