作者: P. Córdoba-Torres , T.J. Mesquita , O. Devos , B. Tribollet , V. Roche
DOI: 10.1016/J.ELECTACTA.2012.04.020
关键词:
摘要: Abstract This paper presents experimental evidences of an intrinsic coupling between the α and Q parameters constant phase elements (CPE) used in equivalent electrical circuits for EIS data fitting. Clear correlations have been found two different conditions, anodic dissolution scale deposit, which CPE behavior appears as result a time distribution originated from surface inhomogeneity. Results are agreement with function that relates interfacial quantities such ohmic charge transfer resistances, also characteristic capacitance whose meaning is addressed here. Although this relationship was initially derived theoretical model perfect caused by double-layer capacity along interface, it has extensively literature to estimate interface very complex systems without any definitive evidence it. However, its exportability real can be explained fact deduced simple general arguments. In we argue on these ideas basis evidences.