Optical characteristics of thin rutile films on fused quartz substrates
作者： B. M. Ayupov , V. V. Atuchin , T. I. Grigor’eva , L. D. Pokrovskii , M. S. Lebedev
DOI: 10.1007/S11182-006-0128-3
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摘要: … In our case, we used a glycerin and water mixture to investigate the samples on quartz glass substrates [14]. The optical removal of beam 2 (Fig. 2) from the receiver field of view in the …
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G. E. Jellison, L. A. Boatner, J. D. Budai, B.-S. Jeong, D. P. Norton, Spectroscopic ellipsometry of thin film and bulk anatase (TiO2) Journal of Applied Physics. ,vol. 93, pp. 9537- 9541 ,(2003) , 10.1063/1.1573737
J. Robertson, Interfaces and defects of high-K oxides on silicon Solid-state Electronics. ,vol. 49, pp. 283- 293 ,(2005) , 10.1016/J.SSE.2004.11.011
J Rodrıguez, M Gomez, J Ederth, GA Niklasson, CG Granqvist, Thickness Dependence of the Optical Properties of Sputter Deposited Ti Oxide Films Thin Solid Films. ,vol. 365, pp. 119- 125 ,(2000) , 10.1016/S0040-6090(99)01109-8
B. M. Ayupov, S. A. Prokhorova, Optical Anisotropy of Phthalocyanine Films Optics and Spectroscopy. ,vol. 90, pp. 446- 451 ,(2001) , 10.1134/1.1358458
Gang He, Qi Fang, Liqiang Zhu, Mao Liu, Lide Zhang, The structure and thermal stability of TiO2 grown by the plasma oxidation of sputtered metallic Ti thin films Chemical Physics Letters. ,vol. 395, pp. 259- 263 ,(2004) , 10.1016/J.CPLETT.2004.07.090
M. Es-Souni, I. Oja, M. Krunks, Chemical solution deposition of thin TiO2-anatase films for dielectric applications Journal of Materials Science: Materials in Electronics. ,vol. 15, pp. 341- 344 ,(2004) , 10.1023/B:JMSE.0000025674.21086.CC
Jean M. Bennett, Emile Pelletier, G. Albrand, J. P. Borgogno, B. Lazarides, Charles K. Carniglia, R. A. Schmell, Thomas H. Allen, Trudy Tuttle-Hart, Karl H. Guenther, Andreas Saxer, Comparison of the properties of titanium dioxide films prepared by various techniques. Applied Optics. ,vol. 28, pp. 3303- 3317 ,(1989) , 10.1364/AO.28.003303
A.G. Dirks, H.J. Leamy, Columnar microstructure in vapor-deposited thin films Thin Solid Films. ,vol. 47, pp. 219- 233 ,(1977) , 10.1016/0040-6090(77)90037-2
J. A. Nelder, R. Mead, A Simplex Method for Function Minimization The Computer Journal. ,vol. 7, pp. 308- 313 ,(1965) , 10.1093/COMJNL/7.4.308
B. M. Ayupov, Determination of optical properties variation of silicon and glass surfaces after mechanical and plasma treatments by monochromatic ellipsometry Optik. ,vol. 109, pp. 145- 149 ,(1998)