Grazing incidence Mössbauer spectroscopy: new method for surface layers analysis
作者： Sobir M. Irkaev , Marina A. Andreeva , Valentin G. Semenov , Genadii N. Belozerskii , Oleg V. Grishin
DOI: 10.1016/0168-583X(93)95954-4
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摘要: Abstract The aims of this series papers are to describe a spectrometer for simultaneous investigation Mossbauer spectra from: (1) specularly reflected gamma-rays, (2) secondary electron, (3) characteristic X-ray, and (4) scattered gamma-rays (part I); present general theory such indicate some unusual characteristics features at grazing angles II); give quantitative analysis experimental 57 Fe films which shows that incidence mossbauer spectroscopy (GIMS) is really new method surface III).
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