Microscopic nature of the asymmetric hysteresis in the insulator-metal transition of VO2 revealed by spectroscopic ellipsometry
作者： Bruno Gompf , Audrey Berrier , Angelika Polity , Martin Dressel , Florian Kuhl
DOI: 10.1063/1.5055296
关键词:
摘要: Systematic spectroscopic ellipsometry investigations have been performed in order to elucidate the asymmetric insulator-to-metal transition thin VO2 films. The comprehensive analysis of obtained macroscopic optical response yields a hysteretic behavior, and particular its asymmetry, when framework an anisotropic effective medium approximation taking into account volume fraction metal inclusions as well their shape. We reveal microscopic details percolation transition, namely that shape goes through several plateaus, seen evolution factor on both sides region resulting different critical fractions at for heating cooling cycles.
scitation.org
harvard.edu
sci-hub.st 参考文章(38)
Marc K. Dietrich, Benedikt G. Kramm, Martin Becker, Bruno K. Meyer, Angelika Polity, Peter J. Klar, Influence of doping with alkaline earth metals on the optical properties of thermochromic VO2 Journal of Applied Physics. ,vol. 117, pp. 185301- ,(2015) , 10.1063/1.4919433
Yanhan Zhu, Yong Zhao, Mark Holtz, Zhaoyang Fan, Ayrton A. Bernussi, Effect of substrate orientation on terahertz optical transmission through VO_2 thin films and application to functional antireflection coatings Journal of The Optical Society of America B-optical Physics. ,vol. 29, pp. 2373- 2378 ,(2012) , 10.1364/JOSAB.29.002373
F. J. Morin, Oxides Which Show a Metal-to-Insulator Transition at the Neel Temperature Physical Review Letters. ,vol. 3, pp. 34- 36 ,(1959) , 10.1103/PHYSREVLETT.3.34
E. J. Garboczi, K. A. Snyder, J. F. Douglas, M. F. Thorpe, Geometrical percolation threshold of overlapping ellipsoids Physical Review E. ,vol. 52, pp. 819- 828 ,(1995) , 10.1103/PHYSREVE.52.819
György J. Kovács, Danilo Bürger, Ilona Skorupa, Helfried Reuther, René Heller, Heidemarie Schmidt, Effect of the substrate on the insulator–metal transition of vanadium dioxide films Journal of Applied Physics. ,vol. 109, pp. 063708- ,(2011) , 10.1063/1.3563588
V. Eyert, VO2: A Novel View from Band Theory Physical Review Letters. ,vol. 107, pp. 016401- 016401 ,(2011) , 10.1103/PHYSREVLETT.107.016401
H. S. Choi, J. S. Ahn, J. H. Jung, T. W. Noh, D. H. Kim, Mid-infrared properties of a VO 2 film near the metal-insulator transition Physical Review B. ,vol. 54, pp. 4621- 4628 ,(1996) , 10.1103/PHYSREVB.54.4621
Xiaofeng Xu, Xinfeng He, Haiyang Wang, Quanju Gu, Shuaixu Shi, Huaizhong Xing, Chunrui Wang, Jing Zhang, Xiaoshuang Chen, Junhao Chu, The extremely narrow hysteresis width of phase transition in nanocrystalline VO2 thin films with the flake grain structures Applied Surface Science. ,vol. 261, pp. 83- 87 ,(2012) , 10.1016/J.APSUSC.2012.07.098
F. Brouers, J. P. Clerc, G. Giraud, J. M. Laugier, Z. A. Randriamantany, Dielectric and optical properties close to the percolation threshold. II Physical Review B. ,vol. 47, pp. 666- 673 ,(1991) , 10.1103/PHYSREVB.47.666
Amos Sharoni, Juan Gabriel Ramírez, Ivan K. Schuller, Multiple Avalanches across the Metal-Insulator Transition of Vanadium Oxide Nanoscaled Junctions Physical Review Letters. ,vol. 101, pp. 026404- ,(2008) , 10.1103/PHYSREVLETT.101.026404