Multivariate analysis for scanning tunneling spectroscopy data

作者: Junsuke Yamanishi , Shigeru Iwase , Nobuyuki Ishida , Daisuke Fujita

DOI: 10.1016/J.APSUSC.2017.09.124

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摘要: Abstract We applied principal component analysis (PCA) to two-dimensional tunneling spectroscopy (2DTS) data obtained on a Si(111)-(7 × 7) surface explore the effectiveness of multivariate for interpreting 2DTS data. demonstrated that several components originated mainly from specific atoms at can be extracted by PCA. Furthermore, we showed hidden in spectra decomposed (peak separation), which is difficult achieve with normal without support theoretical calculations. Our an additional powerful way analyze and extract information large amount spectroscopic

参考文章(29)
John F. Watts, John Wolstenholme, An Introduction to Surface Analysis by XPS and AES ,(2003)
J Enkovaara, C Rostgaard, J J Mortensen, J Chen, M Dułak, L Ferrighi, J Gavnholt, C Glinsvad, V Haikola, H A Hansen, H H Kristoffersen, M Kuisma, A H Larsen, L Lehtovaara, M Ljungberg, O Lopez-Acevedo, P G Moses, J Ojanen, T Olsen, V Petzold, N A Romero, J Stausholm-Møller, M Strange, G A Tritsaris, M Vanin, M Walter, B Hammer, H Häkkinen, G K H Madsen, R M Nieminen, J K Nørskov, M Puska, T T Rantala, J Schiøtz, K S Thygesen, K W Jacobsen, Electronic structure calculations with GPAW: a real-space implementation of the projector augmented-wave method Journal of Physics: Condensed Matter. ,vol. 22, pp. 253202- 253202 ,(2010) , 10.1088/0953-8984/22/25/253202
P. E. Blöchl, Projector augmented-wave method Physical Review B. ,vol. 50, pp. 17953- 17979 ,(1994) , 10.1103/PHYSREVB.50.17953
H. Gawronski, M. Mehlhorn, K. Morgenstern, Imaging phonon excitation with atomic resolution. Science. ,vol. 319, pp. 930- 933 ,(2008) , 10.1126/SCIENCE.1152473
Joseph A. Stroscio, R. M. Feenstra, A. P. Fein, Imaging electronic surface states in real space on the Si(111) 2×1 surface Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. ,vol. 5, pp. 838- 841 ,(1987) , 10.1116/1.574321
Kevin M. Mc Evoy, Michel J. Genet, Christine C. Dupont-Gillain, Principal component analysis: a versatile method for processing and investigation of XPS spectra. Analytical Chemistry. ,vol. 80, pp. 7226- 7238 ,(2008) , 10.1021/AC8005878
John P. Perdew, Kieron Burke, Matthias Ernzerhof, Generalized Gradient Approximation Made Simple Physical Review Letters. ,vol. 77, pp. 3865- 3868 ,(1996) , 10.1103/PHYSREVLETT.77.3865
Joseph A. Stroscio, R. M. Feenstra, A. P. Fein, Electronic Structure of the Si(111)2 × 1 Surface by Scanning-Tunneling Microscopy Physical Review Letters. ,vol. 57, pp. 2579- 2582 ,(1986) , 10.1103/PHYSREVLETT.57.2579
P. A. Moskowitz, H. L. Yeh, S. K. Ray, Thermal dry process soldering Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. ,vol. 4, pp. 838- 840 ,(1986) , 10.1116/1.573786