Polymer Characterization with the Atomic Force Microscope

摘要: Atomic force microscopy is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution [1]. The universal character repulsive forces between the tip and sample, which are employed analysis in AFM, enables examination even single molecules without disturbance their integrity [2]. Being initially developed as analogue scanning tunneling (STM) high-resolution profiling non-conducting surfaces, AFM has into multifunctional technique suitable topography, adhesion, mechanical, other properties on scales from tens microns to nanometers [3].