Spring-stops for a bi-level test fixture

摘要: Improved spring-stops for a bi-level test fixture of the type that includes an electronic circuit device receiving face moveable between in-circuit and functional testing levels probe support plate are disclosed. A spring-loaded is provided below plate, plurality elongated rods extend transferring resilient force to face. The transferred opposes exerted on from either operator or automatic equipment selectable vacuum such moves selected one incircuit levels. individually friction-fit reciprocating motion in low coefficient friction compressive strength bushing. Each bushing into corresponding opening therefor plate. material bushings normalizes rod induced strain way as substantially eliminate seizing while maintaining air-tight seal.