Microcircuit test device with multi-axes probe control

摘要: A tool for testing the miniaturized circuitry of silicone wafer devices. ring-shaped structure is supported on a casting or platform movement along X and Z axes in horizontal plane. probe suspended from element contact with lead-in point device to be tested. The may moved Y vertical axis relative ring, being controlled by single lever which acts between ring probe. Movement screw-type pressure-exerting also serves as pivot axes. high performance board act junction so that probes connected cable runs around ring. extends radially therefrom at location such it suitable external control circuitry.