Photoacoustic spectroscopy analysis of thin semiconductor samples

作者: L. Bychto , M. Maliński

DOI: 10.1016/J.OPELRE.2018.06.005

关键词:

摘要: Abstract This paper is an analysis of determination possibility the optical absorption coefficient spectra thin semiconductor layers from their normalized photoacoustic amplitude spectra. Influence multiple reflections light in on and presented discussed detail. Practical formulae for spectrum as a function are derived presented. Next, they were applied computations In 2 S 3 deposited glass substrate. method was experimentally verified with transmission method.

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