Post-Production Test Strategies for Approximation Circuits
作者： Arun Chandrasekharan , Daniel Große , Rolf Drechsler , Arun Chandrasekharan , Daniel Große
DOI: 10.1007/978-3-319-98965-5_6
关键词:
摘要: Post-production test or simply is the process of sorting out defective chips from proper ones after fabrication. This chapter examines impact approximations in post-production and proposes methodologies that have potential for significant yield improvement. To best our knowledge, this first systematic approach considering design level test.
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