Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement

摘要: Acceptable faults in a circuit under test (CUT) refer to those that have no or only minor impacts on the performance of CUT. A with an acceptable fault may be marketable for some specific applications. Therefore, by carefully dealing these during testing, significant yield improvement can achieved. Previous studies shown patterns generated conventional automatic pattern generation procedure detect all unacceptable also many ones, resulting severe loss achievable improvement. In this paper, we present novel methodology called multiple set detection (MTSD) totally eliminate overdetection problem. basic method is first presented, which depicts fundamental scheme generate appropriate sets MTSD. We then describe enhanced significantly reduce total number patterns. Solid theoretical derivations are provided validate effectiveness proposed methods. Experimental results show general 80%-99% reduction achieved compared previous work addressing