作者: Paul B. Cornia , John R. Baker , Timothy T. Spencer
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摘要: A system (20) for diagnosing defects in electronic assemblies is disclosed. The comprises a knowledge base (26) storing information regarding the assembly receiving current test failure data an (12). further pattern search section (36) comparing to stored (26). voting (40) also provided generating recommended repair procedure eliminate defect Finally, historical generation (46) which updates with whether eliminated defect.