Electrical contact to porous silicon by electrodeposition of iron

作者: F Ronkel , J.W Schultze , R Arens-Fischer

DOI: 10.1016/0040-6090(95)08045-7

关键词:

摘要: Electrodeposition of iron into porous n-type silicon (n-PS) was investigated. The electrodeposition performed potentiostatically as well potentiodynamically. Current efficiency proved by anodic dissolution. deposition is only possible after removal the oxide layer, which covers surface and pore walls n-PS. deposit studied with X-ray photoelectron spectroscopy sputter depth profiling.

参考文章(4)
W. Lang, P. Steiner, F. Kozlowski, Porous silicon electroluminescent devices Journal of Luminescence. ,vol. 57, pp. 341- 349 ,(1993) , 10.1016/0022-2313(93)90152-D
M. Jeske, J.W. Schultze, M. Thönissen, H. Münder, Electrodeposition of metals into porous silicon Thin Solid Films. ,vol. 255, pp. 63- 66 ,(1995) , 10.1016/0040-6090(94)05605-D
M. Jeske, K. G. Jung, J. W. Schultze, M. Thönissen, H. Münder, XPS investigations of electrochemically modified porous silicon layers Surface and Interface Analysis. ,vol. 22, pp. 363- 366 ,(1994) , 10.1002/SIA.740220179