作者: A. Asthana , T. Shokuhfar , Q. Gao , P. Heiden , C. Friedrich
DOI: 10.1063/1.3466663
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摘要: We report here, the deformation driven modulation of electrical transport properties an individual TiO2 nanotube via in situ transmission electron microscopy (TEM) using a scanning tunneling system. The current-voltage characteristics each revealed that under bending within elastic limit, conductivity can be enhanced. High resolution TEM and diffraction pattern reveal nanotubes have tetragonal structure (a=0.378 nm, c=0.9513 nm, I41/amd). Analysis based on metal-semiconductor-metal model suggests in-shell, surface defect-driven conduction modes electron–phonon coupling effect are responsible for modulated semiconducting behaviors.