Probing nanoscale conductance of monolayer graphene under pressure
作者： Sangku Kwon , Sunghyun Choi , HJ Chung , Heejun Yang , Sunae Seo
DOI: 10.1063/1.3609317
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摘要: The correlation between charge transport and mechanical deformation of the single layer graphene was studied with conductive probe atomic force microscopy/friction microscopy in ultra-high vacuum. By measuring current friction on a that is under stress, we identify crossover two regimes density depend applied pressure. We suggest difference work function as well change state formation dipole field are responsible for this behavior.
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