作者: Hyunwoo Park , Hyeongsu Choi , Namgue Lee , Chanwon Jung , Yeonsik Choi
DOI: 10.1016/J.CERAMINT.2020.02.047
关键词:
摘要: … We used atomic layer deposition (ALD) to evaluate the effect of single Al 2 O 3 cycle insertion at various locations on SnO 2 and Al-doped SnO 2 thin film transistors (TFTs). The ALD …