作者: Jacob C.H. Phang , Daniel S.H. Chan
DOI: 10.1016/0379-6787(86)90002-5
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摘要: Abstract Various methods for recovering solar cell lumped circuit model parameters from experimental characteristics are briefly reviewed. The advantages of extracting illuminated highlighted. These include the availability accurate analytical expressions developed recently. A commonly used method parameter recovery by curve fitting minimises σ which is defined as r.m.s. relative current errors between and theoretical characteristics. This demonstrated to be unreliable when with have been collected linear analogue digital systems, or certain data point distributions. more reliable minimisation criterion ϵ proposed. based on area difference Computation experiments show that use results in much both dark characteristics, its accuracy almost independent distribution. also provides a good basis comparing quality fit models