作者: JJ Yoon , SI Jung , HJ Park , HK Suh , MH Jeon
DOI: 10.1016/J.PHYSE.2004.08.054
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摘要: Abstract The Optical characteristics of InAs quantum dots (QDs) embeded in InAlGaAs on InP have been investigated by photoluminescence (PL) spectroscopy and time-resolved PL. Four different QD samples are grown using molecular beam epitaxy, all the five-stacked dot layers with a barrier thickness. PL yield from QDs was increased an increase thickness barrier, emission peak positions were measured around 1.5 μm at room temperature. decay time carrier is decreased abruptly sample 5 nm barrier. This feature explained tunneling coupling effect vertical direction probably defect generation.