作者: Shu-wen Xue , Jian Chen , Chang-wei Zou
DOI: 10.1007/S11801-014-3206-8
关键词:
摘要: ZnS:Na thin films with (111) preferred orientation were deposited on glass substrates by vacuum evaporation method. The as-prepared annealed in flowing argon at 400–500 °C to improve the film crystallinity and electrically activate dopants. structural, optical electrical properties of are investigated X-ray diffraction (XRD), photoluminescence (PL), transmittance measurements four-point probe Results show that amorphous, exhibit after annealing 400 −500 °C. PL emissions 414 nm 439 enhanced due increase intrinsic defects induced thermal annealing. However, all samples high resistivity heavy self-compensation.