Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy

摘要: Near-field optical microscopy provides clue advantages for the future nanoscale inspection of organic and inorganic materials providing ultra-short time resolution improved spatial confinement. Starting from basic properties waves, this contribution summarises what chemical physical information may be collected when performing such (near-field) experiments resulting in specific functional material under consideration. Also near-field (SNOM) is discussed both theoretical experimental point view, directly leading to modern type scattering (s-SNOM). That method will definitely lead expected realm revival local detection tracking systems on 10 nm scale.