作者: E.C. Lima , E.B. Araújo , I.K. Bdikin , A.L. Kholkin
DOI: 10.1016/J.MATERRESBULL.2012.06.058
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摘要: Abstract This work demonstrates the existence of a self-polarization effect in Pb(Zr0.50Ti0.50)O3 thin films with no preferential orientation. Piezoresponse Force Microscopy (PFM) and dielectric measurements were used to study origin this effect. The presence only one peak shifting slightly negative side piezoresponse histogram indicates studied films. An increase was observed when film thickness increases from 200 nm 710 nm. results suggest that Schottky barriers and/or mechanical coupling near film–electrode interface are not main mechanisms responsible for