作者: K. Murakami , Y. Wakabayashi , K. Minami , M. Esashi
DOI: 10.1109/MEMSYS.1993.296953
关键词:
摘要: Cryogenic reactive ion etching (RIE) has been used to fabricate microstructures. The cryogenic system a cathode stage that is temperature controlled from 0 -140 degrees C. A magnetic field and narrow gap between electrodes are introduced increase plasma density. behavior of silicon polyimide film investigated. Directional was achieved at low temperature. etch rate increased by using Sm-Co permanent magnets also high flow the gas under constant pressure. In case wafer etching, maximum 1.6 mu m/min with normalized side less than 0.02 -120 Etching selectivity over 900 power density 4.0 W/cm/sup 2/. 0.01 an 0.8 -100 RIE can be 3-D structures aspect ratio. >