Implantation Metallurgy—Equilibrium Alloys

作者: S.M. MYERS

DOI: 10.1016/B978-0-12-341818-0.50009-7

关键词:

摘要: Publisher Summary This chapter describes ion implantation as a powerful tool for the study of alloying phenomena in metals. It also presents several characteristics and some selected examples use investigating equilibrium alloys. Ion-implanted alloys differ important respects from their thermally prepared counterparts, even at temperatures where system rapidly evolves to collection phases. is this uniqueness that leads new metallurgical information. However, such properties introduce considerations design interpretation experiments. The discusses general features implanted metals bear on These include following: (1) evolution initial state toward thermal equilibrium, (2) precipitation, (3) diffusion time-dependent composition profile. most information about composition-versus-depth profile identities microstructures precipitated Depth profiling may be accomplished number ways; however, backscattering analysis sputter are used frequently. Both methods have sufficient sensitivity depth resolution characterize layers, both widely applicable. Their complementary degree, either more suitable particular purpose.

参考文章(33)
S. M. Myers, R. A. Langley, Study of the diffusion of Au and Ag in Be using ion beams Journal of Applied Physics. ,vol. 46, pp. 1034- 1042 ,(1975) , 10.1063/1.322207
W.K. Chu, J.W. Mayer, M-A. Nicolet, T.M. Buck, G. Amsel, F. Eisen, Principles and applications of ion beam techniques for the analysis of solids and thin films Thin Solid Films. ,vol. 17, pp. 1- 41 ,(1973) , 10.1016/0040-6090(73)90002-3
Robert A. Johnson, Nghi Q. Lam, Solute segregation in metals under irradiation Physical Review B. ,vol. 13, pp. 4364- 4375 ,(1976) , 10.1103/PHYSREVB.13.4364
J. W. Coburn, Eric Kay, Techniques for elemental composition profiling in thin films Critical Reviews in Solid State and Materials Sciences. ,vol. 4, pp. 561- 590 ,(1973) , 10.1080/10408437308245843
A. Fontell, E. Arminen, M. Turunen, Application of the backscattering method for the measurement of diffusion of zinc in aluminium Physica Status Solidi (a). ,vol. 15, pp. 113- 119 ,(1973) , 10.1002/PSSA.2210150113
G. M. Hood, R. J. Schultz, The diffusion of manganese in aluminium Philosophical Magazine. ,vol. 23, pp. 1479- 1489 ,(1971) , 10.1080/14786437108217015
S. M. Myers, D. E. Amos, D. K. Brice, Modeling of enhanced diffusion under ion irradiation Journal of Applied Physics. ,vol. 47, pp. 1812- 1819 ,(1976) , 10.1063/1.322897