Thick stress-free amorphous-tetrahedral carbon films with hardness near that of diamond
作者： T. A. Friedmann , J. P. Sullivan , J. A. Knapp , D. R. Tallant , D. M. Follstaedt
DOI: 10.1063/1.120515
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摘要: … a-tC layer, which are extracted from the fit of the simulation to the experimental force versus depth response are the yield stress … using the yield stress and elasticity of the layer in a hypo…
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