Anomalous magnetoresistance of thin copper films
作者： M.E. Gershenon , V.N. Gubankov
DOI: 10.1016/0038-1098(82)90244-7
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摘要: Abstract Thin copper films exhibit the anomalous magnetoresistance (AMR), which depends on magnetic field orientation versus film plane and is due to electron localization. Spin-orbit interaction spin-flip scattering by paramagnetic impurities strongly affect character of temperature AMR dependences.
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