作者: Liu Hong-Mei , Zhao Quan-Liang , Cao Mao-Sheng , Yuan Jie , Duan Zhong-Xia
DOI: 10.1088/0256-307X/25/11/079
关键词:
摘要: Pb(Zr0.53, Ti0.47)O3 (PZT) films with thicknesses of 0.8μm, 2μm and 4μm are prepared by a sol-gel method their longitudinal piezoelectric coefficients analysed. The results show that the PZT thick films, whose density is closer to bulk PZT, has better crystallization, d33 much larger than those thin films. A microcantilever actuated 4-μm-thick film fabricated its displacement measured in different frequencies voltages. increases linearly increasing bias, maximum 0.544 μm observed at 30kHz for 5V bias. resonant frequency obtained experiment matches quite well theoretical result, it shown could be controlled predicated.