作者: Jingwu Yang , Jinming Duan , Daniel Fornasiero , John Ralston
DOI: 10.1021/JP0224113
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摘要: The formation of very small gas bubbles (so-called “nanobubbles”) at structured solid−water interfaces has been studied using the tapping mode atomic force microscopy (TMAFM) imaging technique. Silicon oxide wafer surfaces were prepared with different degrees nanometer scale surface roughness and hydrophobicity. Small do not form on smooth, hydrophilic, or dehydroxylated silicon immersed in aqueous solutions under known levels supersaturation. Randomly distributed observed over whole observation methylated controlled roughness. Bubbles formed rough, larger less-densely than those a smooth similar process bubble coalescence was as function time. macroscopic contact angle, measured respect to phase, is from microscopic angle detected by TMAFM appears be due in...