Crystal oscillator and the use thereof in semiconductor fabrication

作者: Anthony J. Telensky , John M. Cohn , Jeffrey P. Gambino , Lawrence A. Clevenger , William J. Murphy

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摘要: Systems and methods are provided for implementing a crystal oscillator to monitor control semiconductor fabrication processes. More specifically, method is that includes performing at least one process on material of an integrated circuit (IC) disposed within processing chamber. The further monitoring by electronic the chamber presence or absence predetermined substance generated process. controlling based detected oscillator.