System and method for executing functional scanning in an integrated circuit environment
作者： Zhiyuan Wang , Zhanglei Wang , Hongxia Fang , Xinli Gu
DOI:
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摘要: An example method is provided and includes executing a functional test for an integrated circuit observing failure associated with the circuit. The also scan mode in order to reproduce A state of locked when occurs, subsequently recovered structure In more particular embodiments, states are evaluated compared against other model that did not experience any identify latest cycle could trigger earliest observe failure.
google.it 参考文章(42)
Gary L. Swoboda, David R. Matt, Emulation suspension mode with stop mode extension ,(2000)
Su-Jaen Huang, Kenneth C. Gross, Aleksey M. Urmanov, Lawrence G. Votta, Method and apparatus for determining the effects of temperature variations within a computer system ,(2003)
Louis C. Parrillo, Wireless motor vehicle diagnostic and software upgrade system ,(1992)
Jack E. Mott, Method of system state analysis ,(1988)
Kornelija Zgonc, Aleksey M. Urmanov, Kenny C. Gross, Method and apparatus for identifying mechanisms responsible for “no-trouble-found” (NTF) events in computer systems ,(2003)
Philip Kenneth Cihiwsky, Andrew Chung-Shiang Jaw, Online performance monitoring and fault diagnosis technique for direct current motors as used in printer mechanisms ,(1990)
Donn A. Rochette, Richard C. Owens, Lorenz G. Simpkins, Remote maintenance monitoring system ,(1989)
Oren Eliezer, Bogdan Staszewski, Ran Katz, Elida Isabel de Obaldia, Dirk Leipold, On-chip receiver sensitivity test mechanism ,(2004)
Fred Harold Bednar, Frank Gerald Arcella, James Moore Forker, Jan Jozef Schreurs, Online valve diagnostic monitoring system ,(1988)
Roman Trobec, Izidor Jerebic, Optimization of Diagnostic Examination joint international conference on vector and parallel processing parallel processing. pp. 761- 772 ,(1994) , 10.1007/3-540-58430-7_66