Structure of pentacene thin films
作者： Ricardo Ruiz , Alex C. Mayer , George G. Malliaras , Bert Nickel , Giacinto Scoles
DOI: 10.1063/1.1826229
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摘要: Grazing incidence x-ray diffraction, reflectivity and atomic force microscopy have been performed to study the structure of pentacene thin films on oxidized Si substrates from submonolayer multilayer coverages. The volume unit cell in film phase is almost identical that bulk phase, thus molecular packing efficiency effectively same both phases. forming first monolayer remains for at least 190A thick. in-plane islands also unchanged within a substrate temperature range 0
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