Failure characterization at head/disk interface of hard disk drive

作者: Yang Mingch

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摘要: The characterization of sub-micron features and particles between hard disk interface (HDI) is becoming even more important to the industry in fields corrosion, tribology contamination. In this paper, media scratch are characterized with AES, TOF-SIMS, SEM/EDX LPC. main causes resulted serious have been analyzed discussed.

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