作者: J Rodriguez Fernandez , J C Gomez Sal
DOI: 10.1088/0022-3727/21/7/019
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摘要: The authors present a procedure for determining the ratio between real and apparent (measured) electrical resistivities. calculations based on finite-element method can be applied to different geometries positions of contact potentials, three-dimensional case using polycrystalline samples single crystals with anisotropic resistivity. results are compared other analytical isotropic importance choice directions in single-crystal measurements is stressed. A general systematic description how use given. An application situation also discussed.