Quality assurance of fluorescence peak intensities in EDXRF analysis of environmental samples

摘要: Abstract A quality assurance methodology based on the Analysis of Precision was applied to results obtained by EDXRF. It found that statistical control could be achieved in processing X-ray spectra with program MicroSAMPO and an optimized Covell program, but not a conventional Gaussian fitting program. Final were consistent priori precision approximately 1% from sample preparation stage, no significant uncertainty attributed backscatter/fundamental parameter approach quantification. The method under investigation suitable for analysis environmental samples chromium-contaminated grounds.