Diffraction Peak Displacement in Residual Stress Samples Due to Partial Burial of the Sampling Volume

摘要: Near-surface measurement of residual strain and stress with neutron scattering complements extends the surface measurements by X-ray diffraction. However, diffraction near surfaces are sensitive to volume alignment, beam wavelength spread collimation and, unless properly understood, can give large fictitious strains. An analytic calculation a numerical computation peak shifts due partial burial sampling have been made compared experimental measurement. Peak in strain-free nickel sample were determined for conditions where is displaced so that gage partially buried sample. The numerically computed take into account collimation, source size, monochromator crystal mosaic collection diffracted intensity linear position-sensitive counter.