作者: A.P. Burden , J.L. Hutchison
DOI: 10.1016/S0008-6223(97)00001-8
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摘要: Abstract The behaviour of graphite particles immersed in helium gas and irradiated with an electronbeam has been investigated. Because this treatment was performed a modified high resolution transmission electron microscope, the rapid morphological microstructural changes that occurred could be directly observed. results have implications for future controlled environment microscopy carbonaceous materials characterisation such microscopes. It is also shown processes can provide insight into ion-irradiation induced damage mechanism fullerene generation.