引用次数
引用: 1,270
H-指数: 21
I10-指数 : 29
出版物: 58
Start-ups or upstarts?
Adrian P. Burden
Nano Today 2 ( 4) 6
2
2007
Microstructural characterisation of carbonaceous dust generated during the deposition of diamond-like carbon coatings
A.P Burden , J.V Anguita , S.R.P Silva
Thin Solid Films 332 252 -256
7
1998
Fingerprinting Objects.
Adrian P Burden , Peter M Moran
Innovation 5 ( 2)
2005
Singapore Targets OLEDs-Singapore aims to become a world leader in advanced displays, and the island nation is developing the technological infrastructure to seed and support OLED design and
Adrian P Burden
Information Display 21 ( 2) 16 -21
2005
Real-time observation of fullerene generation in a modified electron microscope
A.P. Burden , J.L. Hutchison
Journal of Crystal Growth 158 185 -188
20
1996
Enhancing the field emission properties of amorphous carbon films by thermal annealing
A.P. Burden , R.D. Forrest , S.R.P. Silva
Thin Solid Films 337 257 -260
21
1999
Degradation study in flexible substrate organic light-emitting diodes
L. Ke , R.S. Kumar , S.J. Chua , A.P. Burden
Applied Physics A 81 ( 5) 969 -974
19
2005
Incorporating consumer-priced field-emitting inks into arrays of triode devices
A.P. Burden , H.E. Bishop , M. Brierley , J.M. Friday
Solid-state Electronics 45 ( 6) 987 -996
15
2001
Printed FEDs-technical advances and manufacturing cost modelling
W. Taylor , S.M. Baigrie , H.E. Bishop , M. Brierley
international vacuum microelectronics conference 177
2001
Electron field emission from amorphous carbon thin films as a function of annealing
R.D. Forrest , A.P. Burden , R.U.A. Khan , S.R.P. Silva
Surface & Coatings Technology 577 -582
4
1998
Materials for field emission displays
A.P. Burden
International Materials Reviews 46 ( 5) 213 -231
27
2001
Exploiting voltage contrast scanning electron microscopy to investigate conductive polymer composite resettable fuse devices
A.P. Burden , W. Guo , J.L. Hutchison
Polymer 39 ( 18) 4211 -4217
7
1998
The stability of nitrogen-containing amorphous carbon films after annealing at moderate temperatures
A.P. Burden , E. Mendoza , S.R.P. Silva , G.A.J. Amaratunga
Diamond and Related Materials 7 ( 2-5) 495 -498
17
1998
An investigation of the electron irradiation of graphite in a helium atmosphere using a modified electron microscope
A.P. Burden , J.L. Hutchison
Carbon 35 ( 4) 567 -578
19
1997
In situ fullerene formation—The evidence presented☆
A.P. Burden , J.L. Hutchison
Carbon 36 1167 -1173
22
1998
A study of the effects of nitrogen incorporation and annealing on the properties of hydrogenated amorphous carbon films
R.U.A. Khan , A.P. Burden , S.R.P. Silva , J.M. Shannon
Carbon 37 ( 5) 777 -780
13
1999
An investigation of the electron irradiation of carbon blacks in various gas atmospheres using a modified electron microscope
A.P. Burden , S. Baigrie , J.L. Hutchison
Journal of Microscopy 192 ( 1) 7 -19
3
1998
The microstructural dependence of the opto-electronic properties of nitrogenated hydrogenated amorphous carbon thin films
S.R.P. Silva , R.U.A. Khan , A.P. Burden , J.V. Anguita
Thin Solid Films 332 ( 1) 118 -123
22
1998
Fullerene-like carbon nanoparticles generated by radiofrequency plasma-enhanced chemical vapour deposition
A. P. Burden , S. R. P. Silva
Philosophical Magazine Letters 78 ( 1) 15 -19
6
1998
Electron-energy-loss spectroscopy characterization of the sp 2 bonding fraction within carbon thin films
A. J. Papworth , C. J. Kiely , A. P. Burden , S. R. P. Silva
Physical Review B 62 ( 19) 12628 -12631
76
2000