A Physical Surface Roughness Model and Its Applications

作者: Gerald Gold , Klaus Helmreich

DOI: 10.1109/TMTT.2017.2695192

关键词:

摘要: … fundamentals, surface roughness metrology and commonly used roughness parameters are … effects of surface roughness as well as a corresponding surface impedance concept are …

参考文章(21)
G. Gold, K. Helmreich, Surface impedance concept for modeling conductor roughness international microwave symposium. pp. 1- 4 ,(2015) , 10.1109/MWSYM.2015.7167013
G. Gold, K. Helmreich, A physical model for skin effect in rough surfaces european microwave conference. pp. 1011- 1014 ,(2012) , 10.23919/EUMC.2012.6459235
E. Hammerstad, O. Jensen, Accurate Models for Microstrip Computer-Aided Design international microwave symposium. pp. 407- 409 ,(1980) , 10.1109/MWSYM.1980.1124303
Ruihua Ding, Henning Braunisch, Leung Tsang, Wenmo Chang, Simulation and measurement correlation of random rough surface effects in interconnects electrical performance of electronic packaging. ,(2012) , 10.1109/EPEPS.2012.6457894
Paul G. Huray, Stephen Hall, Steven Pytel, Femi Oluwafemi, Richard Mellitz, Daniel Hua, Peng Ye, Fundamentals of a 3-D “snowball” model for surface roughness power losses workshop on signal propagation on interconnects. pp. 121- 124 ,(2007) , 10.1109/SPI.2007.4512227
Ruihua Ding, Leung Tsang, Henning Braunisch, Random rough surface effects in interconnects studied by small perturbation theory in waveguide model 2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems. pp. 161- 164 ,(2011) , 10.1109/EPEPS.2011.6100215
Soumya De, Aleksandr Gafarov, Marina Y. Koledintseva, R. Joe Stanley, James L. Drewniak, Scott Hinaga, Semi-automatic copper foil surface roughness detection from PCB microsection images international symposium on electromagnetic compatibility. pp. 132- 137 ,(2012) , 10.1109/ISEMC.2012.6351796
Allen F. Horn, John W. Reynolds, James C Rautio, Conductor profile effects on the propagation constant of microstrip transmission lines international microwave symposium. pp. 868- 871 ,(2010) , 10.1109/MWSYM.2010.5515933
Reinhard Danzl, Franz Helmli, Stefan Scherer, Focus Variation – a Robust Technology for High Resolution Optical 3D Surface Metrology Strojniski Vestnik-journal of Mechanical Engineering. ,vol. 57, pp. 245- 256 ,(2011) , 10.5545/SV-JME.2010.175