High-frequency test probe assembly for microcircuits and associated methods
作者： Seymour S. Lenz , Anthony G. Klele
DOI:
关键词:
摘要: A test probe for microcircuits includes a unitary elongated electrically conductive arm. rear end portion is connecting to circuit; front contacting circuit be tested and has an upwardly extending tip. central positioned adjacent the portion, between which slot side surfaces. Typically sandwiched in spaced relation two ground probes having portions ground, are movably affixed retaining block slots holding probes. The configuration of signal probe, slot, dependent upon spacing probes, retainer material, frequency signal, impedance.
google.co.uk 参考文章(29)
Jeremy N. Burr, Edward M. Godshalk, Jeffrey A. Williams, High-frequency probe tip assembly ,(1994)
Randy Schwindt, Probe holder for low current measurements ,(1997)
Dale T. Trenary, Probe card for integrated circuit chip ,(1989)
Vernon Letchworth Brown, Nawal Kishore Sharma, Leo Carrillo, Circuit board contact resistance probe ,(1975)
Randy J. Schwindt, Low-current probe card ,(2001)
Tom Long, Mohamed Sabri, J. Lynn Saunders, Contact device for making connection to an electronic circuit device ,(1997)
Paul A. Tervo, Clarence E. Cowan, Low-current pogo probe card ,(2005)
Seiichiro Aigo, Unitary probe assembly ,(1981)
Iradj Shahriary, Apparatus for on-wafer testing of electrical circuits ,(1985)
Joseph Fjelstad, Apparatus for electrically testing bare printed circuits ,(1998)