作者: Ilke Arslan , Emmanuelle A. Marquis , Mark Homer , Michelle A. Hekmaty , Norman C. Bartelt
DOI: 10.1016/J.ULTRAMIC.2008.05.008
关键词:
摘要: Scanning transmission electron microscope tomography and atom-probe are both three-dimensional techniques on the nanoscale. We demonstrate here combination of by analyzing very same volume an Al-Ag alloy specimen. This comparison allows us to directly visualize theoretically known artifacts each technique experimentally, providing insight into optimal parameters use for reconstructions assessing quality reconstruction. The accurate morphology compositional information in three dimensions at nanoscale provides a route new level materials characterization understanding.