Effect of heterogeneous interface on the microwave dielectric properties of Ca(Mg1/3Nb2/3)O3/CaTiO3 thin films
作者： Jing Zhou , Runrun Li , Ru Li , Wen Chen
DOI: 10.1016/J.APSUSC.2012.06.010
关键词:
摘要: Abstract Effects of heterogeneous interface on the dielectric properties Ca(Mg1/3Nb2/3)O3/CaTiO3 (CMN/CT) thin films fabricated by Pechini technique were investigated in this work. As-prepared CMN/CT uniform, smooth and dense with thickness around 190 nm. AFM results showed that root mean square (RMS) surface roughness decreased as numbers increases NI-11 sample possesses minimal RMS. Compared measured results, calculated constant was slightly lower increasing numbers, increased gradually while loss decreased. These implied interfaces favorable for improvement properties, which also attributed to formation accumulation depletion layers at reduced lattice relaxation. Being indexed XRD patterns EDS spectrum, inter-diffusion between CMN CT layer further confirmed. Moreover, had single phase their own independently regardless number.
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