Online Estimation of Architectural Vulnerability Factor for Soft Errors

作者: Xiaodong Li , Sarita V. Adve , Pradip Bose , Jude A. Rivers

DOI: 10.1145/1394608.1382150

关键词:

摘要: As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior research shown that there is significant architecture-level masking, many solutions take advantage of this effect. work also thatthe degree such masking can vary significantly across workloads between individual workload phases, motivating dynamic adaptation optimal cost benefit. For adaptation, it be able accurately estimate amount ofmasking or architecture vulnerability factor (AVF) online, while program running. Unfortunately, existing estimating AVF often based offline simulators hard implement in real This paper proposes a novel way using simple modifications processor. The estimation method applies both logic storage structures Compared previous methodsfor AVF, our does not require any simulation calibration different workloads. We tested with widely used simulator from industry, four processor 100 200 intervals each eleven SPEC benchmarks. results show provides acceptably accurate estimates at runtime. absoluteerror rarely exceeds 0.08 all application structures, mean absolute given structure combination always within 0.05.

参考文章(19)
H.T. Nguyen, Y. Yagil, A systematic approach to SER estimation and solutions international reliability physics symposium. pp. 60- 70 ,(2003) , 10.1109/RELPHY.2003.1197722
E.W. Czeck, D.P. Siewiorek, Effects of transient gate-level faults on program behavior [1990] Digest of Papers. Fault-Tolerant Computing: 20th International Symposium. pp. 236- 243 ,(1990) , 10.1109/FTCS.1990.89371
N.J. Wang, J. Quek, T.M. Rafacz, S.J. Patel, Characterizing the effects of transient faults on a high-performance processor pipeline dependable systems and networks. pp. 61- 70 ,(2004) , 10.1109/DSN.2004.1311877
H. Sharangpani, H. Arora, Itanium processor microarchitecture IEEE Micro. ,vol. 20, pp. 24- 43 ,(2000) , 10.1109/40.877948
M. Moudgill, J.-D. Wellman, J.H. Moreno, Environment for PowerPC microarchitecture exploration IEEE Micro. ,vol. 19, pp. 15- 25 ,(1999) , 10.1109/40.768496
Nicholas J. Wang, Aqeel Mahesri, Sanjay J. Patel, Examining ACE analysis reliability estimates using fault-injection Proceedings of the 34th annual international symposium on Computer architecture - ISCA '07. ,vol. 35, pp. 460- 469 ,(2007) , 10.1145/1250662.1250719
T. Karnik, P. Hazucha, Characterization of soft errors caused by single event upsets in CMOS processes IEEE Transactions on Dependable and Secure Computing. ,vol. 1, pp. 128- 143 ,(2004) , 10.1109/TDSC.2004.14
X. Li, S.V. Adve, Pradip Bose, J.A. Rivers, SoftArch: an architecture-level tool for modeling and analyzing soft errors dependable systems and networks. pp. 496- 505 ,(2005) , 10.1109/DSN.2005.88
Christopher Weaver, Joel Emer, Shubhendu S. Mukherjee, Steven K. Reinhardt, Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor ACM SIGARCH Computer Architecture News. ,vol. 32, pp. 264- 275 ,(2004) , 10.1145/1028176.1006723
Kristen R. Walcott, Greg Humphreys, Sudhanva Gurumurthi, Dynamic prediction of architectural vulnerability from microarchitectural state Proceedings of the 34th annual international symposium on Computer architecture - ISCA '07. ,vol. 35, pp. 516- 527 ,(2007) , 10.1145/1250662.1250726