Scanning tunneling microscopy of an ion‐bombarded PbS(001) surface

作者: I. H. Wilson , N. J. Zheng , U. Knipping , I. S. T. Tsong

DOI: 10.1063/1.100312

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摘要: Freshly cleaved (001) surfaces of single crystalline PbS were bombarded by 8 keV Kr+ ions at a dose 3×1012 cm−2. Atomically resolved scanning tunneling microscopy (STM) images taken showing damaged areas due to individual ion impacts. Analysis STM image shows shallow impact crater, stacking fault, displacement Pb2+ and S2− from their regular surface sites, migration interstitials the surface.

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