作者: Anton Barty , David Paganin , Keith Nugent
DOI: 10.1016/S1079-4042(01)80039-4
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摘要: Publisher Summary This chapter discusses the application of technique phase measurement to high energy electrons in an electron microscope. work is applied Lorentz microscopy magnetic structures at domain level. The ideas behind recovery strategy are reviewed and some practical issues that apply examined chapter. Phase structure microscopic samples successfully imaged using a transmission microscope, both direction magnitude magnetization directly cobalt grain transport-of-intensity equation (TIE)-based retrieval techniques. TIE can be used measure wave exiting from sample, once appropriate calibration microscope system has been performed, measurements so made agree with results holography on same sample. for imaging not limited can, principle, image any or otherwise, introduces shift into beam.