Scanning Optical Microscopy

摘要: Abstract Microscopy using a scanning approach is reviewed, with numerous references to previous work, as at 1987, before the confocal laser microscope was widely available commercially. The advantages of imaging technique are described. principles microscopy introduced. Use Bessel beam illumination in discussed. This combination can increase spatial resolution while retaining some optical sectioning. method point source detailed. For example, differential phase contrast may be performed obtain information. allows different types spectroscopy spatially resolved fashion. An advantage point-source systems for such applications that imaging, incident radiation, separated from wavelength selection and analysis emitted thus simplifying system design resulting superior performance. excite carriers semiconducting sample electronic properties materials devices investigated. Advantages object scanning, rather than described, including use heterodyne synthetic pinhole, nonlinear two-photon fluorescence CARS (coherent anti-Stokes Raman spectroscopy). It should noted well being commercial microscopes were available, special beams appreciated, two photon first experimentally demonstrated.